Difference between revisions of "Rikesh Patel"

From Applied Optics Wiki
Jump to: navigation, search
(→‎Journal publications)
(→‎Journal publications)
Line 37: Line 37:
  
 
[http://eprints.nottingham.ac.uk/view/people/Patel=3ARikesh=3A=3A.html University repository for Rikesh Patel]
 
[http://eprints.nottingham.ac.uk/view/people/Patel=3ARikesh=3A=3A.html University repository for Rikesh Patel]
 +
 +
<bibtex>
 +
@article {Hirsch20170194,
 +
author = {Hirsch, M. and Catchpole-Smith, S. and Patel, R. and Marrow, P. and Li, Wenqi and Tuck, C. and Sharples, S. D. and Clare, A. T.},
 +
title = {Meso-scale defect evaluation of selective laser melting using spatially resolved acoustic spectroscopy},
 +
volume = {473},
 +
number = {2205},
 +
year = {2017},
 +
doi = {10.1098/rspa.2017.0194},
 +
publisher = {The Royal Society},
 +
abstract = {Developments in additive manufacturing technology are serving to expand the potential applications. Critical developments are required in the supporting areas of measurement and in process inspection to achieve this. CM247LC is a nickel superalloy that is of interest for use in aerospace and civil power plants. However, it is difficult to process via selective laser melting (SLM) as it suffers from cracking during rapid cooling and solidification. This limits the viability of CM247LC parts created using SLM. To quantify part integrity, spatially resolved acoustic spectroscopy (SRAS) has been identified as a viable non-destructive evaluation technique. In this study, a combination of optical microscopy and SRAS was used to identify and classify the surface defects present in SLM-produced parts. By analysing the datasets and scan trajectories, it is possible to correlate morphological information with process parameters. Image processing was used to quantify porosity and cracking for bulk density measurement. Analysis of surface acoustic wave data showed that an error in manufacture in the form of an overscan occurred. Comparing areas affected by overscan with a bulk material, a change in defect density from 1.17\% in the bulk material to 5.32\% in the overscan regions was observed, highlighting the need to reduce overscan areas in manufacture.},
 +
issn = {1364-5021},
 +
URL = {http://rspa.royalsocietypublishing.org/content/473/2205/20170194},
 +
eprint = {http://rspa.royalsocietypublishing.org/content/473/2205/20170194.full.pdf},
 +
journal = {Proceedings of the Royal Society of London A: Mathematical, Physical and Engineering Sciences}
 +
}
 +
</bibtex>
  
 
<bibtex>
 
<bibtex>

Revision as of 14:28, 11 October 2017

Rikesh Patel

Location

202/307 Tower, University Park

C38 SIOS Pharmacy, University Park

Phone

+44 (0)115 84-67892

Email

rikesh.patelAtnotts.png

Education/Posts

2004-2008 MEng Electronic and Computer Engineering (1st Class), University of Nottingham

2008-2014 PhD Electrical and Electronic Engineering (Thesis), University of Nottingham

2013-2014 Research Assistant, University of Nottingham

2014- Research Associate, University of Nottingham

Awards

  • University of Nottingham interdisciplinary research funding award (UNICAS) - 2014
  • Applied optics group internal research proposal review award (1st place) - 2015

Journal publications

University repository for Rikesh Patel

Hirsch, M., Catchpole-Smith, S., Patel, R., Marrow, P., Li, Wenqi, Tuck, C., Sharples, S. D., Clare, A. T. - Meso-scale defect evaluation of selective laser melting using spatially resolved acoustic spectroscopy
Proceedings of the Royal Society of London A: Mathematical, Physical and Engineering Sciences 473(2205),2017
http://rspa.royalsocietypublishing.org/content/473/2205/20170194
Bibtex
Author : Hirsch, M., Catchpole-Smith, S., Patel, R., Marrow, P., Li, Wenqi, Tuck, C., Sharples, S. D., Clare, A. T.
Title : Meso-scale defect evaluation of selective laser melting using spatially resolved acoustic spectroscopy
In : Proceedings of the Royal Society of London A: Mathematical, Physical and Engineering Sciences -
Address :
Date : 2017

Rikesh Patel, Wenqi Li, Richard J. Smith, Steve D. Sharples, Matt Clark - Orientation imaging of macro-sized polysilicon grains on wafers using spatially resolved acoustic spectroscopy
Scripta Materialia 140:67 - 70,2017
http://www.sciencedirect.com/science/article/pii/S1359646217303846
Bibtex
Author : Rikesh Patel, Wenqi Li, Richard J. Smith, Steve D. Sharples, Matt Clark
Title : Orientation imaging of macro-sized polysilicon grains on wafers using spatially resolved acoustic spectroscopy
In : Scripta Materialia -
Address :
Date : 2017

Matthias Hirsch, Rikesh Patel, Wenqi Li, Guangying Guan, Richard K. Leach, Steve D. Sharples, Adam T. Clare - Assessing the capability of in-situ nondestructive analysis during layer based additive manufacture
Additive Manufacturing 13:135 - 142,2017
http://www.sciencedirect.com/science/article/pii/S2214860416301877
Bibtex
Author : Matthias Hirsch, Rikesh Patel, Wenqi Li, Guangying Guan, Richard K. Leach, Steve D. Sharples, Adam T. Clare
Title : Assessing the capability of in-situ nondestructive analysis during layer based additive manufacture
In : Additive Manufacturing -
Address :
Date : 2017

Richard J. Smith, Matthias Hirsch, Rikesh Patel, Wenqi Li, Adam T. Clare, Steve D. Sharples - Spatially resolved acoustic spectroscopy for selective laser melting
Journal of Materials Processing Technology 236:93 - 102,2016
http://www.sciencedirect.com/science/article/pii/S0924013616301352
Bibtex
Author : Richard J. Smith, Matthias Hirsch, Rikesh Patel, Wenqi Li, Adam T. Clare, Steve D. Sharples
Title : Spatially resolved acoustic spectroscopy for selective laser melting
In : Journal of Materials Processing Technology -
Address :
Date : 2016

Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark - Widefield two laser interferometry
Opt. Express 22(22):27094--27101, Nov 2014
http://www.opticsexpress.org/abstract.cfm?URI=oe-22-22-27094
Bibtex
Author : Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark
Title : Widefield two laser interferometry
In : Opt. Express -
Address :
Date : Nov 2014

Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark - Ultrastable heterodyne interferometer system using a CMOS modulated light camera
Opt. Express 20(16):17722--17733, Jul 2012
http://www.opticsexpress.org/abstract.cfm?URI=oe-20-16-17722
Bibtex
Author : Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark
Title : Ultrastable heterodyne interferometer system using a CMOS modulated light camera
In : Opt. Express -
Address :
Date : Jul 2012

Rikesh Patel, Matt Clark, Samuel Achamfuo-Yeboah - Widefield ultrastable heterodyne interferometry using a custom CMOS modulated light camera
Imaging and Applied Optics pp. JWA14,2011
http://www.osapublishing.org/abstract.cfm?URI=AIO-2011-JWA14
Bibtex
Author : Rikesh Patel, Matt Clark, Samuel Achamfuo-Yeboah
Title : Widefield ultrastable heterodyne interferometry using a custom CMOS modulated light camera
In : Imaging and Applied Optics -
Address :
Date : 2011

Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark - Widefield heterodyne interferometry using a custom CMOS modulated light camera
Opt. Express 19(24):24546--24556, Nov 2011
http://www.opticsexpress.org/abstract.cfm?URI=oe-19-24-24546
Bibtex
Author : Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark
Title : Widefield heterodyne interferometry using a custom CMOS modulated light camera
In : Opt. Express -
Address :
Date : Nov 2011

Conferences

  • UON Institute of Aerospace exposition, Nottingham UK - 2010
  • KTP innovate event, London UK - 2011
  • OSA Optics and Photonics Congress, Toronto Canada - 2011
  • IOP Photon12, Durham UK - 2012
  • IOP Anglo-French physical acoustic conference AFPAC2015, Frejus France - 2015
  • BINDT Aerospace event 2015, Sheffield UK - 2015
  • 4th International Symposium on Laser Ultrasonics LU2015, Evanston IL USA - 2015
  • 5th International Symposium on Laser Ultrasonics LU2015, Linz, Austria – 2016
  • Early Stage Researchers RCNDE event, Manchester UK - 2016
  • RCNDE University of Nottingham industrial tour, Nottingham UK - 2016
  • Optics+Ultrasound III, Nottingham UK – 2016
  • RCNDE technology transfer event, Warwick, UK - 2017
Retrieved from "http://optics.eee.nott.ac.uk/w/index.php?title=Rikesh_Patel&oldid=3484"